The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Dec. 28, 2023
Advanced Micro Devices, Inc., Santa Clara, CA (US);
David Kirk Mcallister, Draper, UT (US);
Andrew Erin Kensler, Bellevue, WA (US);
Holger Gruen, Munich, DE;
Advanced Micro Devices, Inc., Santa Clara, CA (US);
Abstract
A device that defines and uses a bounding volume for testing for ray intersections with a displaced micro-mesh. The bounding volume is indirectly based on a twisted prism composed of two triangles and three bilinear patches that bounds the displaced micro-mesh. Instead of detecting intersection with the bilinear patches directly, tetrahedrons that circumscribe the bilinear patches can be used instead. The two bases and the three tetrahedra make fourteen triangles. The device tests for potential intersection with the displaced micro-mesh by testing for an intersection with any of the fourteen triangles. Various other methods and systems are also disclosed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile