The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Apr. 25, 2023
Sony Group Corporation, Tokyo, JP;
Sony Corporation of America, New York, NY (US);
Alexandre Zaghetto, San Jose, CA (US);
Danillo Bracco Graziosi, Flagstaff, AZ (US);
Ali Tabatabai, Cupertino, CA (US);
SONY GROUP CORPORATION, Tokyo, JP;
SONY CORPORATION OS AMERICA, New York, NY (US);
Abstract
An electronic device and method for estimation of density distortion metric for processing of point cloud geometry is provided. The electronic device acquires a reference point cloud, encodes the reference point cloud to generate encoded point cloud data, and decodes the encoded point cloud data to generate a test point cloud. The electronic device further generates a first local density map representing local density values at points of the reference point cloud. The electronic device determines locations in the test point cloud corresponding to locations of the points. The electronic device generates a second local density map representing local density values at the determined locations. The electronic device computes a value of density distortion metric based on the first local density map and the second local density map. The electronic device controls a display device to render a reconstruction quality of the test point cloud based on the computed value.