The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Jun. 02, 2022
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Atsushi Miyamoto, Tokyo, JP;

Hiromi Nishiura, Tokyo, JP;

Naoaki Kondo, Tokyo, JP;

Akira Ito, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

In anomaly determination using an autoencoder, the present invention enables highly accurate anomaly determination with respect to an unknown anomaly image, even in the case of learning using only a non-defective image. In a learning step of learning a parameter of the autoencoder using a non-defective learning image /{f_i/} captured of a non-defective test target, an anomaly determination accuracy rate Rc of the non-defective learning image /{f_i/} is used as an evaluation value, and a dimension compression rate Rd of a code layer of the autoencoder is maximized or an input signal amount to the code layer or an output signal amount from the code layer is decreased, such that the anomaly determination accuracy rate Rc is maximized or becomes at least a predetermined threshold th.


Find Patent Forward Citations

Loading…