The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Sep. 29, 2024
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Tetsu Wada, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/50 (2006.01); G06T 5/70 (2024.01); G06T 7/11 (2017.01); G06V 10/141 (2022.01);
U.S. Cl.
CPC ...
G06T 5/50 (2013.01); G06T 5/70 (2024.01); G06T 7/11 (2017.01); G06V 10/141 (2022.01); G06T 2207/20221 (2013.01);
Abstract

An imaging support apparatus includes a processor, in which the processor is configured to, for each of a plurality of divided regions that are obtained by dividing an imaging target region and that have an overlapping region which is a region in which the divided regions partially overlap with each other, cause a light source to irradiate the overlapping region of the divided region with a reference light beam, acquire a divided image including a reference image indicating the reference light beam for each divided region by causing an imaging apparatus to image the divided region in a state where the overlapping region is irradiated with the reference light beam, and calculate a blurriness amount of an overlapping region image indicating the overlapping region for each divided region based on the reference image in the divided image.


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