The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Jul. 12, 2023
Realtek Semiconductor Corp., Hsinchu, TW;
Yi-Ting Bao, Hsinchu, TW;
Chia-Wei Yu, Hsinchu, TW;
Hao-Ran Wang, Changsha City, CN;
Tien-Hung Lin, Hsinchu, TW;
REALTEK SEMICONDUCTOR CORP., Hsinchu, TW;
Abstract
A method for training a super-resolution model, a super-resolution method, and a system are provided, and the super-resolution method and the system are implemented through an AI super-resolution model that is trained by the method. In the method, an input image is provided, and a magnification ratio and an image quality threshold are set. Pixel values of the input image are retrieved, and image features of the input image are extracted. Multiple channel images are obtained through a super-resolution model based on the image features and the magnification ratio. Phase information can be obtained according to the magnification ratio and positions of output pixels, and the phase information is used to obtain masks mapping to the channel images. Therefore, an output image can be reshuffled. After a comparison with the image quality threshold, model parameters of the output image can be assessed for training the AI super-resolution model.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile