The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Jun. 09, 2023
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Neeraj Kapoor, Bareilly, IN;

Dileep Ranganathan, San Jose, CA (US);

Srivatsan Kasturi, Saratoga, CA (US);

Sukesh Roy, San Ramon, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/20 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06T 1/20 (2013.01); G06F 3/0604 (2013.01); G06F 3/0644 (2013.01); G06F 3/067 (2013.01);
Abstract

Apparatuses, systems, and techniques to obtain metric data of a computing resource service provider. In at least one embodiment, a backlog of metrics data of one or more graphics processing unit (GPUs) that failed to be obtained is identified. A portion of the metrics identified as real-time metrics is prioritized over obtaining the backlog of metrics data when obtaining the metrics data of the one or more GPUs in an order from newest to oldest.


Find Patent Forward Citations

Kapoor, Neeraj. (2026). Techniques to obtain metrics data (U.S. Patent No. 12731203). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12731203

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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