The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Nov. 10, 2022
Board of Supervisors of Louisiana State University and Agricultural and Mechanical College, Baton Rouge, LA (US);
Louisiana Tech Research Corporation, Ruston, LA (US);
Leslie G. Butler, Baton Rouge, LA (US);
Michele L. Maasberg, Baton Rouge, LA (US);
Charles Hartman, Baton Rouge, LA (US);
Ian Taylor, Baton Rouge, LA (US);
Board of Supervisors of Lousiana of Lousiana State University and Agricultural and Mechanical College, Baton Rouge, LA (US);
Louisiana Tech Research Corporation, Ruston, LA (US);
Refined Imaging LLC, Baton Rouge, LA (US);
Abstract
A method and apparatus for differentiating between authentic and counterfeit item, and legacy additive manufactured (AM) components securely throughout the lifecycle using grating interferometry, blockchain, and smart contracts. The method includes fabrication of a trust anchor by laser power modulation to selectively create porosity which can encode digital information within the component using programmable invisible ink (PGII). X-ray interferometry reads out the digital information as well as texture unique to the component. A quick response (QR) code is implemented with other anti-counterfeiting features to increase efficiency. A smart contract between X-ray interferometry radiography instruments and a blockchain database establishes item provenance. The characteristics of PGII are compatible with additive manufacturing, as well as other manufacturing processes such as injection molding and casting. The method and apparatus have minimal impact on the component fabrication, detects counterfeiting and sabotage, and is conformal to existing item identification standards.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile