The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Jan. 11, 2023
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Neha Srivastava, New Delhi, IN;

Gautam Tikoo, Noida, IN;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G01R 31/28 (2006.01); G06F 11/27 (2006.01); G06F 21/62 (2013.01); G06F 21/72 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G01R 31/2851 (2013.01); G06F 11/27 (2013.01); G06F 21/6218 (2013.01); G06F 21/72 (2013.01); G06F 2221/034 (2013.01);
Abstract

An integrated circuit includes a secure asset, a security system, and an efficacy decoder. The security system is triggered to operate in one of its functional states. Further, the security system receives various test requests for an access to the secure asset, and determines, based on the triggered functional state thereof, one or more test requests authorized to access the secure asset. The efficacy decoder similarly receives the test requests and determines one or more allowable requests for the triggered functional state of the security system. Further, the efficacy decoder determines an efficacy value for the security system based on a comparison between the test requests authorized by the security system and the allowable requests associated with the triggered functional state. The efficacy value is indicative of a security level of the security system operating in the triggered functional state.


Find Patent Forward Citations

Srivastava, Neha. (2026). Testing of security systems in integrated circuits (U.S. Patent No. 12730898). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12730898

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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