The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Nov. 01, 2024
Applicant:
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Inventors:
Parminder Singh Sethi, Punjab, IN;
Bing Liu, Tianjin, CN;
Assignee:
EMC IP Holding Company LLC, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 9/455 (2018.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 9/45558 (2013.01); G06F 11/301 (2013.01); G06F 11/3466 (2013.01); G06F 2009/45591 (2013.01);
Abstract
One example method includes identifying a source of a performance issue in a virtualized environment. Telemetry data is collected relative to the flow of a request/response in the virtualized environment. The collected telemetry data can be compared to normal data. A probability can be generated for each layer to identify which of the layers is the most likely source of the performance issue. The layers can be prioritized based on their probability. The most likely layer or virtual machine is recommended for analysis to determine the cause of the performance issue.