The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Aug. 08, 2023
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Ichiro Kanno, Chiba, JP;
Hiroki Watanabe, Chiba, JP;
Mari Kaburagi, Chiba, JP;
Hayato Ida, Ibaraki, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 9/097 (2006.01); C01B 33/02 (2006.01); G03G 9/08 (2006.01);
U.S. Cl.
CPC ...
G03G 9/09725 (2013.01); C01B 33/02 (2013.01); G03G 9/0819 (2013.01); G03G 9/0821 (2013.01); G03G 9/09716 (2013.01); C01P 2004/62 (2013.01);
Abstract
The fine particle is a silicon-containing fine particle, wherein the number-average diameter of the fine particle is 0.05 μm to 0.30 μm; the proportion of the silicon atom with reference to the total of the elements is at least 20% according to fluorescent x-ray measurement of the fine particle; and, with respect to the silicon atom proportions measured in analysis by x-ray photoelectron spectroscopy while irradiating with Ar-Kα radiation and etching, the proportions of silicon atoms having prescribed structures vary at prescribed depths.