The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Mar. 29, 2023
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Akiko Watano, Minamiashigara, JP;

Ryuji Saneto, Minamiashigara, JP;

Katsumi Sasata, Minamiashigara, JP;

Fumitake Mitobe, Minamiashigara, JP;

Hiroshi Sato, Minamiashigara, JP;

Yukito Saitoh, Minamiashigara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F21V 8/00 (2006.01); G02B 27/01 (2006.01);
U.S. Cl.
CPC ...
G02B 6/0056 (2013.01); G02B 6/0026 (2013.01); G02B 6/005 (2013.01); G02B 27/0172 (2013.01); G02B 2027/0147 (2013.01); G02B 2027/0178 (2013.01);
Abstract

Provided is an optical element that can display a clear image having no blurriness in AR glasses or the like. The optical element includes: a substrate; and a laminate that is provided on the substrate and where a plurality of liquid crystal layers obtained by aligning a liquid crystal compound are laminated, in which the liquid crystal layers have a liquid crystal alignment pattern in which a direction of an optical axis derived from the liquid crystal compound changes while continuously rotating in at least one in-plane direction, and in at least one of the liquid crystal layers, an arithmetic mean value of differences between maximum film thicknesses and minimum film thicknesses obtained by observing 10 cross-sections with a scanning electron microscope is 0.1 μm or less.


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