The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Jul. 08, 2022
Applicant:

Techwidu Co., Ltd., Suwon-si, KR;

Inventors:

Hyoung-Rae Kim, Hwaseong-si, KR;

Dong-Yul Lee, Suwon-si, KR;

Jun-Hyung Ha, Yongin-si, KR;

Assignee:

TECHWIDU CO., LTD., Suwon-si, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3163 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3163 (2013.01); G01R 31/2831 (2013.01);
Abstract

Provided is a test circuit configured to receive an inspection command from automatic test equipment (ATE) and test a device under test (DUT), and the test circuit includes a plurality of analog inspection circuits electrically connected to the DUT to test an operation thereof, and a digital control circuit configured to control operations of the analog inspection circuits, wherein the digital control circuit and the analog inspection circuits are located apart from each other.


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