The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Aug. 07, 2020
Ntt, Inc., Tokyo, JP;
Tomokazu Oda, Musashino, JP;
Atsushi Nakamura, Musashino, JP;
Daisuke Iida, Musashino, JP;
Hiroyuki Oshida, Musashino, JP;
NTT, Inc., Tokyo, JP;
Abstract
An electric field distribution variation cycle measuring apparatus and method involve measuring or estimating a variation cycle of an electric field distribution in an optical fiber. Pump light and probe light may be converted into a higher-order mode and cause the pump light to be incident on while end of the optical fiber and probe light to be incident on the other end of the optical fiber. A Brillouin gain of simulated Brillouin scattering may be acquired, where the stimulated Brillouin scattering is generated when the pump light and the probe light collide in the optical fiber. A variation cycle of the Brillouin gain may be set as a variation cycle of an electric field distribution of a higher-order mode.