The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Apr. 22, 2021
Nissan Motor Co., Ltd., Kanagawa, JP;
Nissan Motor Co., Ltd., Kanagawa, JP;
Abstract
A quality evaluation device operates to: detect a defect present in a component based on a detection result obtained by a non-destructive inspection method; extract feature amounts of the defect from detection information of the defect; specify an evaluation target site in which the defect is present in the component; acquire one or more usage state information values associated with the evaluation target site, the usage state information values being estimated values that represent physical characteristics of the evaluation target site when the component is used; and determine, based at least on the feature amounts and the one or more usage state information values, whether or not the defect is an aggressive defect.