The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Jan. 17, 2024
Applicant:

Tsinghua Shenzhen International Graduate School, Shenzhen, CN;

Inventors:

Hui MA, Shenzhen, CN;

Qianhao Zhao, Shenzhen, CN;

Zheng Hu, Shenzhen, CN;

Tongyu Huang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01); G01J 4/04 (2006.01); G02B 27/28 (2006.01); G02F 1/01 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); G01J 4/04 (2013.01); G02B 27/286 (2013.01); G02F 1/0136 (2013.01);
Abstract

A PSG and PSA configuration optimization method and a polarizing and analyzing system, wherein the method comprises the following steps: adjusting an instrumental matrix W of a PSG and an instrumental matrix A of an PSA to minimize a weighted variance EWV of the instrument matrices of the PSG and the PSA, so as to realize optimization for Gaussian noise; and a sum of each row of the instrumental matrix W of the PSG and the instrumental matrix A of the PSA is 0, so that an estimated variance caused by Poisson noise is independent of the sample, and the estimated variance reaches a minimum value. The present disclosure can suppress the noise to the maximum extent and make the law of the noise independent from the sample, and the distribution law of the noise is the same regardless of the sample to be measured.


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