The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Jan. 16, 2025
The Regents of the University of California, Oakland, CA (US);
Dino Di Carlo, Los Angeles, CA (US);
Daniel R. Gossett, Los Angeles, CA (US);
Henry T.K. Tse, San Francisco, CA (US);
Aram Chung, Los Angeles, CA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
A system for deforming a plurality of particles carried in a sample volume includes a reusable substrate defining an inlet, configured to receive the sample volume, and an outlet, wherein the inlet or outlet is configured to couple to a module to introduce or collect a washing or flushing solution. A fluidic pathway is disposed in the reusable substrate and fluidically couples to the inlet and the outlet and includes a delivery region fluidically coupled to the inlet and configured to focus the plurality of particles along at least one streamline and a deformation region located downstream with respect to the delivery region and formed by an intersection of the fluidic pathway and an opposing inlet channel, wherein flow of a fluid from the opposing inlet channel at the intersection mechanically deforms the plurality of particles passing through the deformation region.