The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Jan. 12, 2024
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Douglas E. Messick, Austin, TX (US);

Sean P. O'donnell, Poughkeepsie, NY (US);

Daniel Alvarado, Pflugerville, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/22 (2006.01); G01K 1/14 (2021.01); G01M 1/00 (2006.01); G01V 1/16 (2006.01); H05K 7/20 (2006.01);
U.S. Cl.
CPC ...
G01L 1/2206 (2013.01); G01K 1/14 (2013.01); G01V 1/16 (2013.01); H05K 7/20781 (2013.01);
Abstract

Systems and methods support a server rack mechanically and gather sensor data from the server rack. For instance, the system may include an apparatus having a frame that is configured to add stiffening to a server rack. On the frame may be disposed various sensors and a computing system to measure stress and strain of the server rack as well as any other appropriate characteristic. The frame may include struts having strain gauges therein, where the strain gauges provide a measurement of stress or strain. Various sensor data may be transmitted from the apparatus to a component outside of the apparatus, such as a data center monitoring application.


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