The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Dec. 12, 2022
Applicants:

Thermo Fisher Scientific (Bremen) Gmbh, Bremen, DE;

Thermo Fisher Scientific (Shanghai) Instruments Co., Ltd., Shanghai, CN;

Inventors:

Shenghai Wu, Shanghai, CN;

Antonella Guzzonato, Bremen, DE;

Cheng Wang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/443 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/443 (2013.01); G01J 2003/2866 (2013.01);
Abstract

A peak position measurement offset is determined in a two-dimensional optical spectrum. A plurality of peaks are identified that appear in both a spectrum obtained from a reference material at known conditions and a spectrum obtained from a sample of interest. The peak position measurement offset is determined by a comparison of a pattern formed by peak positions of the plurality of identified peaks in the spectrum obtained from the sample of interest against the plurality of identified peaks in the spectrum obtained from the reference material.


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