The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Mar. 08, 2024
GM Global Technology Operations Llc, Detroit, MI (US);
Gui Chen, Sterling Heights, MI (US);
Fan Bai, Ann Arbor, MI (US);
Mason David Gemar, Cedar Park, TX (US);
Joon Hwang, Pflugerville, TX (US);
Shu Chen, Rochester Hills, MI (US);
Ibrahim Onifade, Katy, TX (US);
Leila Ghorban Zadeh, Seattle, WA (US);
Christian Haller, Austin, TX (US);
GM GLOBAL TECHNOLOGY OPERATIONS LLC, Detroit, MI (US);
Abstract
A map quality assessment system that evaluates error associated with primary map data includes one or more central computers that execute instructions to determine the error associated with the primary map data, compare the error associated with the primary map data with a range of values defined by one or more quality metric values, and in response to determining the error associated with the primary map data falls within the range of values defined by the one or more quality metric values, retain a template for selecting the primary map data. In response to determining the error associated with the primary map data falls outside the range defined by the one or more quality metric values, the one or more central computers evaluate the primary map data for real-life anomalies within one or more roadways represented by the primary map data.