The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Sep. 01, 2022
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Kazuki Hanada, Osaka, JP;

Katsuaki Okuma, Osaka, JP;

Toshinari Mohri, Osaka, JP;

Takamichi Komatsu, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 31/02 (2006.01); B23K 9/095 (2006.01); B25J 11/00 (2006.01);
U.S. Cl.
CPC ...
B23K 31/02 (2013.01); B23K 9/0953 (2013.01); B25J 11/005 (2013.01);
Abstract

A bead appearance inspection device includes an input unit configured to enter input data related to a welding bead of a workpiece produced by welding, a first determination unit configured to perform a first inspection determination related to a shape of the welding bead based on a comparison between the input data and a master data, k second determination units, where k is an integer of 1 or more, that are equipped with k types of artificial intelligence and that are configured to perform a second inspection determination related to a welding defect of the welding bead based on processings of the k types of artificial intelligence targeting the input data, and a comprehensive determination unit configured to output a result of an appearance inspection of the welding bead to an output device based on determination results of the first determination unit and the k second determination units.


Find Patent Forward Citations

Hanada, Kazuki. (2026). Bead appearance inspection device, bead appearance inspection method, program, and bead appearance inspection system (U.S. Patent No. 12728485). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12728485

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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