The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Sep. 27, 2023
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Kyoung Hyun Park, Daejeon, KR;

Hyun Suk Kim, Daejeon, KR;

Min Jung Kim, Daejeon, KR;

Dae Sub Yoon, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/16 (2006.01); G16H 10/20 (2018.01);
U.S. Cl.
CPC ...
A61B 5/165 (2013.01); G16H 10/20 (2018.01);
Abstract

Provided are a system, apparatus, and method for determining stress. The apparatus according to the present invention includes a communication interface and a processor connected to the communication interface, wherein the processor collects biometric data and survey data of a user through the communication interface, generates a personalized stress classification model on the basis of the biometric data and the survey data, and determines whether the user is stressed using the personalized stress classification model.


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