The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Dec. 24, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Shigeru Nakamura, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/1172 (2016.01); A61B 5/00 (2006.01); G06T 7/30 (2017.01);
U.S. Cl.
CPC ...
A61B 5/1172 (2013.01); A61B 5/0066 (2013.01); G06T 7/30 (2017.01); G06T 2207/10101 (2013.01); G06T 2207/30088 (2013.01);
Abstract

An optical coherence tomography analysis apparatus includes: an acquisition unit that performs optical coherence tomography by applying a light beam, and that acquires three-dimensional luminance data about the skin; a position extraction unit that extracts an epidermis position, for each tomography image obtained by scanning in a fast axis direction of the light beam, in the three-dimensional luminance data about the skin; a connection unit that generates connected three-dimensional data, by adjusting relative positions between tomography images and connecting the tomography images, on the basis of an extraction result of the epidermis position; a flattening unit that generates flattened three-dimensional data, by performing transformation processing of flattening epidermis on the connected three-dimensional data, on the basis of an extraction result of the epidermis position; and a pattern extraction unit that extracts a pattern of the skin corresponding to a predetermined extraction depth, from the flattened three-dimensional data.


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