The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Jun. 26, 2025
Siemens Healthineers Ag, Forchheim, DE;
David Grodzki, Erlangen, DE;
Uvo Hölscher, Erlangen, DE;
Siemens Healthineers AG, Forchheim, DE;
Abstract
Techniques are described for recording of magnetic resonance data to prevent cropping effects. A loss factor indicates an expected reduction of an image reconstructed on the basis of measurement data recorded using the loaded measurement protocol and determines filter parameters for a frequency filter for filtering frequencies of echo signals, received when recording measurement data with the measurement protocol, on the basis of the loss factor and on the basis of the desired field of view, and determines an oversampling factor on the basis of the filter parameters of the frequency filter. The oversampling factor specifies an oversampling to be applied when recording of measurement data. Oversampled measurement data is recorded using the determined filter parameters and the oversampling factor when implementing the loaded measurement protocol.
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