The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Nov. 09, 2023
Applicant:
Apple Inc., Cupertino, CA (US);
Inventors:
Matthew T. Morea, Cupertino, CA (US);
Daniel Mahgerefteh, Campbell, CA (US);
Dylan N. Rees, Los Gatos, CA (US);
Mark A. Arbore, Los Altos, CA (US);
Romain F. Chevallier, Santa Clara, CA (US);
Assignee:
Apple Inc., Cupertino, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10F 77/40 (2025.01); G01J 1/02 (2006.01); H10F 77/124 (2025.01); H10F 77/169 (2025.01);
U.S. Cl.
CPC ...
H10F 77/413 (2025.01); G01J 1/0214 (2013.01); H10F 77/1248 (2025.01); H10F 77/169 (2025.01);
Abstract
An electromagnetic radiation detectors includes anti-reflective epitaxial structures incorporated into an epitaxial stack of the electromagnetic radiation detector. An anti-reflective structures as described herein are grown between (and thereby connect) two lattice-matched epitaxial layers that have different refractive indices. The anti-reflective structure reduces Fresnel reflections that would otherwise occur if the two epitaxial layers were directly connected.