The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jul. 09, 2025
Applicant:

Ofinno, Llc, Reston, VA (US);

Inventors:

Hua Zhou, Vienna, VA (US);

Ali Cagatay Cirik, Chantilly, VA (US);

Esmael Hejazi Dinan, McLean, VA (US);

Hyoungsuk Jeon, Centreville, VA (US);

Gautham Prasad, Herndon, VA (US);

Taehun Kim, Fairfax, VA (US);

Assignee:

Ofinno, LLC, Reston, VA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/318 (2015.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 17/328 (2023.05);
Abstract

A wireless device transmits radio resource control (RRC) messages comprising capability parameters indicating support, for a layer 1 and/or layer 2 triggered mobility (LTM) procedure and within a measurement window, for synchronization signal block (SSB) based inter-frequency layer 1 reference signal received power (RSRP) measurement of a candidate cell with a received time difference, between the candidate cell and a serving cell, larger than a cyclic prefix (CP) length. The device receives RRC messages indicating a measurement window. The device receives a command indicating an uplink transmission of a L1 RSRP report of the candidate cell. The first cell and the candidate cell are inter-frequency configured. The device transmits the L1 RSRP report measured over one or more first SSBs of the candidate cell. The first SSBs are received: via the candidate cell with the received time difference being greater than the CP length, and within the measurement window.


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