The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jul. 17, 2023
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Kei Tasaka, Osaka, JP;

Yuki Iwamoto, Osaka, JP;

Suguru Nakao, Hyogo, JP;

Hiroshi Kunimoto, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 13/641 (2006.01); G01H 1/00 (2006.01); G01H 1/16 (2006.01); G01H 17/00 (2006.01); G06N 3/00 (2023.01);
U.S. Cl.
CPC ...
H01R 13/641 (2013.01); G01H 1/16 (2013.01); G01H 17/00 (2013.01);
Abstract

A fitting detection method according to the present disclosure is a fitting detection method for detecting fitting which includes acquiring first data indicating information generated from vibration, acquiring second data output from a learned model by inputting the first data to the learned model having undergone machine learning using at least information generated from vibration generated by normal fitting as teacher data, determining whether or not the first data is related to fitting based on the second data, and determining whether or not normal fitting is performed based on the first data when the first data is related to fitting.


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