The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Feb. 03, 2022
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Kazuma Maeda, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/42 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
H01J 49/4215 (2013.01); G01N 30/7233 (2013.01);
Abstract

A mass spectrometer capable of performing scan measurement, includes: a provisional event time determining unit to determine a provisional event time to be assigned to a scan measurement event, which is a measurement unit for performing one scan measurement, in accordance with an analysis condition specified by a user; a scan speed selection unit to select a scan speed from candidates such that a measurement time required for one scan measurement does not exceed the provisional event time of the scan measurement event; an event time determining unit to correct the provisional event time of the scan measurement event to a time required for scan measurement under the selected scan speed, and set the provisional event time that has been corrected as an event time of the scan measurement event; and a control information creation unit to create control information for controlling the mass spectrometer based on the event time.


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