The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Sep. 27, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Aditya Dave, Plano, TX (US);

Wei Sun, Allen, TX (US);

Indranil Sinharoy, Richardson, TX (US);

Hao Chen, Allen, TX (US);

Han Wang, Allen, TX (US);

Russell Douglas Ford, Campbell, CA (US);

Satvir S. Bhatia, Sunnyvale, CA (US);

Andrea M. Small, San Francisco, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/58 (2006.01); G01S 7/41 (2006.01); G01S 13/88 (2006.01); G08B 21/04 (2006.01);
U.S. Cl.
CPC ...
G08B 21/043 (2013.01); G01S 7/415 (2013.01); G01S 13/886 (2013.01);
Abstract

A method comprises receiving, by a radar sensor, reflections from at least two points on a body of a user. The method comprises determining, by a processor operatively coupled to the radar sensor, a change of an elevation angle and a rate of change of the elevation angle of the user with respect to the radar sensor, based on the reflections from the at least two points on the body of the user. The method comprises determining changes of a radar cross-section (RCS) associated with the body of the user along an elevation dimension. The method comprises determining whether a fall event occurred based on at least one of: the rate of change and the change of the elevation angle, or the changes of the RCS.


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