The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
May. 24, 2022
Applicant:
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Inventors:
Benjamin P. Wood, Bedford, MA (US);
Jeffrey A. Wallace, Nashua, NH (US);
Marc J. Fredette, Manchester, NH (US);
Assignee:
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/36 (2022.01); G06V 10/143 (2022.01); G06V 10/147 (2022.01); G06V 10/20 (2022.01); G06V 10/94 (2022.01); H04N 25/131 (2023.01); H04N 25/703 (2023.01); H04N 25/708 (2023.01); G06V 20/17 (2022.01);
U.S. Cl.
CPC ...
G06V 10/143 (2022.01); G06V 10/147 (2022.01); G06V 10/255 (2022.01); G06V 10/36 (2022.01); G06V 10/94 (2022.01); H04N 25/131 (2023.01); H04N 25/703 (2023.01); H04N 25/708 (2023.01); G06V 20/17 (2022.01);
Abstract
A passive sensor having a focal plane array with a plurality of pixels captures at least one dual band image. A generalized likelihood ratio test can be applied to the dual band imagery using intermediate images and image kernels or filters to approximate signal detections rather than performing a brute force approach. Further, the approach enables for the determination of detections in a plurality of sub-pixel locations.