The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Sep. 25, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Inwoo Ha, Suwon-si, KR;

Young Hun Sung, Suwon-si, KR;

Nahyup Kang, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06T 3/18 (2024.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01); G06T 3/18 (2024.01);
Abstract

An image processing method includes generating warped image data by warping first reconstructed image data corresponding to a first time point, based on first change data corresponding to a change between first rendered image data corresponding to the first time point and second rendered image data corresponding to a second time point, generating a sampling map that designates a sampling number, a sampling position, or a combination of the sampling number and the sampling position, for each pixel of the second rendered image data corresponding to the second time point by executing a neural sampling map generation model based on the warped image data and scene context information, and rendering the second rendered image data corresponding to the second time point by performing ray tracing on each pixel of the second rendered image data corresponding to the second time point using the sampling map.


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