The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Nov. 26, 2023
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventors:

Yizhang Zhao, Shanghai, CN;

Qing Ye, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 12/10 (2026.01); G06T 7/00 (2017.01); G06T 12/20 (2026.01);
U.S. Cl.
CPC ...
G06T 12/10 (2026.01); G06T 7/0012 (2013.01); G06T 12/20 (2026.01); G06T 2207/10081 (2013.01); G06T 2207/10104 (2013.01); G06T 2211/424 (2013.01);
Abstract

Embodiments of the present disclosure provide a method for parameter imaging. The method includes: obtaining two scan images of an object, wherein scanning ranges of the two scan images have an overlapping region; obtaining frame information by framing the two scan images or two sets of scan data corresponding to the two scan images, wherein the overlapping region in the two scan images corresponds to two frames; and determining metabolic information of a tracer inside the object based on the frame information.


Find Patent Forward Citations

Zhao, Yizhang. (2026). Methods and systems for parameter imaging (U.S. Patent No. 12725333). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12725333

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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