The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Feb. 15, 2022
Applicant:

Konica Minolta, Inc., Tokyo, JP;

Inventors:

Tomoya Okazaki, Tokyo, JP;

Koki Tachi, Tokyo, JP;

Yoshiyuki Takahashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/25 (2022.01); G06T 7/00 (2017.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06V 10/25 (2022.01); G06V 10/761 (2022.01);
Abstract

Provided is an information processing apparatus capable of preventing erroneous detection of an abnormality even in a case where a region other than an inspection target region appears in an image of an object or even in a case where the appearance of the object may partially vary because of the nature of the object. An information processing apparatus includes: a generating section that acquires an image and generates a reconstructed image based on the image; an identification section that identifies an inspection target region in the image based on the image; and a calculation section that calculates a difference in the inspection target region between the image and the reconstructed image.


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