The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Sep. 01, 2023
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventor:

Wangren Xu, San Jose, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); G06N 3/0464 (2023.01); G06T 5/50 (2006.01); G06T 7/20 (2017.01); G06T 11/00 (2006.01); G06V 10/776 (2022.01); G06V 10/96 (2022.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06N 3/0464 (2023.01); G06T 5/50 (2013.01); G06T 7/20 (2013.01); G06T 11/00 (2013.01); G06V 10/776 (2022.01); G06V 10/96 (2022.01); G06T 2207/20081 (2013.01);
Abstract

Disclosed are apparatuses, systems, and techniques for testing and training hardware devices and computer vision models using images augmented with noise. In one embodiment, the techniques include augmenting a plurality of images with noise to generate a plurality of sets of noise-augmented images (NAIs). Individual sets of NAIs include noise of a respective noise level, applying one or more sets of NAIs of the plurality of sets of NAIs to determine one or more accuracy metrics characterizing performance of a computer vision (CV) model for one or more noise levels of respective one or more sets of NAIs, and publishing the CV model in association with the one or more accuracy metrics.


Find Patent Forward Citations

Xu, Wangren. (2026). Noise augmentation (U.S. Patent No. 12725229). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12725229

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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