The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jun. 21, 2021
Applicant:

Anor Technologies Pte. Ltd., Singapore, SG;

Inventors:

Nan Zhang, Singapore, SG;

Haiwen Gu, Singapore, SG;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G01N 1/30 (2006.01); G01N 21/3586 (2014.01); G06N 7/01 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G01N 1/30 (2013.01); G01N 21/3586 (2013.01); G06N 7/01 (2023.01);
Abstract

The present application discloses a measurement unit for holding a sample (including a powder sample in small quantity, a scattered powder sample or an aqueous solution sample) for a terahertz beam irradiation; and a terahertz spectroscopy system with the measurement unit for measuring an absorption signal from the sample. In particular, the terahertz beam can be reflected for multiple times through the sample in the measurement unit for enhancing the absorption signal. The present application discloses three non-destructive methods of measuring the absorption signal of the sample using the terahertz spectroscopy system.


Find Patent Forward Citations

Zhang, Nan. (2026). Terahertz spectroscopy system with specialized measurement unit for non-destructive sample detection (U.S. Patent No. 12725085). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12725085

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