The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Mar. 10, 2023
Capital One Services, Llc, McLean, VA (US);
Ashwin Assysh Sharma, Vienna, VA (US);
Gunther Havel, Portsmouth, NH (US);
Capital One Services, LLC, McLean, VA (US);
Abstract
Methods and systems are described herein for facilitating segmentation of training data using measures of statistical dispersion (e.g., Gini impurities) of dataset features. The system determines, from a training dataset, a target feature and candidate features. The system determines, for the target feature in relation to each candidate feature, first Gini impurities. The system selects a first and second feature having the lowest first Gini impurities. The system determines, for the target feature in relation to a first combination of the first and second features, a second Gini impurity. If the second Gini impurity does not satisfy a threshold, the system selects a third feature having the next lowest first Gini impurity and determines a third Gini impurity for a second combination of the first, second, and third features. If the third Gini impurity satisfies the threshold, the system trains a model using the target, first, second, and third features.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile