The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Apr. 21, 2023
Applicant:

Mellanox Technologies, Ltd., Yokneam, IL;

Inventors:

Elad Mentovich, Tel Aviv, IL;

Itshak Kalifa, Bat Yam, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 10/40 (2022.01); G06N 10/20 (2022.01);
U.S. Cl.
CPC ...
G06N 10/40 (2022.01); G06N 10/20 (2022.01);
Abstract

Quantum systems, devices, and methods are described herein that enable quantum metrology. An example quantum device includes a first quantum measurement module operably coupled with a first quantum system. The first quantum measurement module applies one or more measurements to the first quantum system and obtains first information associated with the first quantum system based on the one or more measurements. The quantum device further includes a first quantum memory structure operably coupled with the first quantum measurement module. A coherence time window associated with the first quantum memory structure is greater than a coherence time window time associated with the first quantum system. The quantum devices and associated memory structures provide a new methodology for a quantum metrology system.


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