The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

May. 17, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jicheon Kim, Suwon-si, KR;

Jinwoo Park, Suwon-si, KR;

Yeonho Jeong, Suwon-si, KR;

Seonil Brian Choi, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3692 (2013.01);
Abstract

A method of simulating an integrated circuit includes providing at least one test case to a simulation tool, obtaining at least one first simulation result and at least one first simulation log from the simulation tool, classifying, with a first machine learning model, the at least one test case into one fail class of a plurality of fail classes, generating at least one renewed test case by applying, with a controller, a solution to the at least one test case, and providing the at least one renewed test case to the simulation tool.


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Quick Actions:

Kim, Jicheon. (2026). Apparatus and method for simulation automation in regression test (U.S. Patent No. 12724697). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12724697

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