The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Dec. 13, 2024
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Kosuke Tsujita, Tokyo, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G06F 3/12 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G03G 15/5029 (2013.01); G03G 15/5016 (2013.01); G06F 3/1204 (2013.01); G06F 3/1208 (2013.01); G06F 3/1256 (2013.01); H04N 1/00031 (2013.01); H04N 1/00087 (2013.01); H04N 1/00206 (2013.01); H04N 1/00244 (2013.01); G03G 2215/00616 (2013.01); G03G 2215/00742 (2013.01); H04N 2201/0094 (2013.01);
Abstract
An inspection apparatus detects a defect of an image formed by scanning a sheet with an image formed thereon conveyed from an image forming unit, wherein the detecting the defect is to detect a defect at an inspection level decided based on sheet management information for linking an inspection level with sheet information and sheet information of the sheet with the image formed thereon.