The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Mar. 19, 2021
Applicant:

Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);

Inventors:

Dongkyun Kang, Tucson, AZ (US);

Cheng Gong, Tucson, AZ (US);

Christopher David Nguyen, Tucson, AZ;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/48 (2006.01); G02B 21/08 (2006.01);
U.S. Cl.
CPC ...
G02B 27/48 (2013.01); G02B 21/082 (2013.01);
Abstract

Speckle-modulated line illumination devices and associated methods are described that enable acquisition of images with high resolution and high speed simultaneously. One example speckle-modulated line illumination device includes a spatially coherent light source having a speckled output, a collimation lens positioned to receive the output of the spatially coherent light source, a cylindrical lens positioned to receive a collimated light produced by the collimation lens, and a diffuser positioned to receive a focused line illumination from the cylindrical lens, and to impart random phase variations in light that is output therefrom. The diffuser is coupled to a movement stage to impart rotational or translational movements to the diffusor as a function of time. Implementations of the disclosed technology can be used to develop reflectance confocal microscopy devices and scattering-based light sheet microscopy devices.


Find Patent Forward Citations

Kang, Dongkyun. (2026). Speckle-reduced illumination for improved scattering-based microscopy (U.S. Patent No. 12724285). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12724285

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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