The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Dec. 29, 2023
Aac Optics (Changzhou) Co., Ltd., Changzhou City, CN;
Shiqi Pan, Changzhou, CN;
AAC OPTICS (CHANGZHOU) CO., LTD., Changzhou City, CN;
Abstract
A microscope objective, including from an exit pupil plane to an object plane: a first lens having a positive refractive power, a second lens having a negative refractive power, a third lens having a positive refractive power, a fourth lens having a negative refractive power, and a fifth lens having a positive refractive power; a focal length of the microscope objective is f, a focal length of the first lens is f1, a focal length of the second lens is f2, a focal length of the third lens is f3, an on-axis distance from the object plane of the microscope objective to an object side surface of the fifth lens is WD, a numerical aperture is NA, and a total optical length is TTL, following relational expressions are satisfied: 0.68≤f3/f≤2.00; −2.20≤f2/f1≤−1.40; 0.15≤WD/TTL≤0.35; 6.00≤f*NA≤9.00. The microscope objective has the characteristics of low distortion, 1.5 times magnification and long operating distance.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile