The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jul. 30, 2020
Applicants:

Centre National DE LA Recherche Scientifique, Paris, FR;

Observatoire DE LA Cote D'azur, Nice, FR;

Université Côte D'azur, Nice Cedex, FR;

Université Grenoble Alpes, Saint-Martin-d'Heres, FR;

Inventors:

François Henault, Grenoble, FR;

Alain Spang, Vence, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 3/00 (2006.01); G01J 9/00 (2006.01); G02B 5/20 (2006.01);
U.S. Cl.
CPC ...
G02B 3/0056 (2013.01); G01J 9/00 (2013.01); G02B 5/20 (2013.01); G02B 2003/0093 (2013.01);
Abstract

The systems for inspecting an optical wave surface output from an optical device, the optical device comprising an output pupil, the inspection system comprising an optical measurement head and a computer for processing the images obtained from said the optical measurement head. The optical measurement head comprises: a density gradient filter, the density varying periodically in the two directions of the space, a matrix array comprising at least four identical lenses, of square form, of the same focal length and disposed symmetrically, a matrix of photodetectors, each of the four lenses forming, of the pupil, an image in the plane of this matrix. The computer for processing the images comprises computation means that make it possible to calculate the partial derivatives of the wave surface Δ(x, y) in the plane of the output pupil.


Find Patent Forward Citations

Henault, François. (2026). System for inspecting surfaces of an optical wave using a gradient density filter (U.S. Patent No. 12724176). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12724176

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