The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Nov. 27, 2024
Ishida Co., Ltd., Kyoto, JP;
Shinya Ikeda, Ritto, JP;
Kazuyuki Sugimoto, Ritto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
An X-ray inspection device includes a conveying unit, an X-ray irradiation unit, an X-ray detection unit, and a control unit configured to inspect whether foreign matter is included in an article based on an X-ray transmission image. The control unit performs a first inspection of using a predetermined threshold value to inspect whether the foreign matter having a lower attenuation rate of X-rays than the article is included in the article, performs a second inspection of using a machine learning algorithm to inspect whether the foreign matter is included inside the article, and determines that the foreign matter is included in the article in a case where the foreign matter common to inspection results of the first inspection and the second inspection is included in the article.