The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jan. 18, 2022
Applicant:

Signify Holding B.v., Eindhoven, NL;

Inventors:

Chun Yang, Shanghai, CN;

Jialong Qiu, Shanghai, CN;

Zhiquan Chen, Shanghai, CN;

Gang Wang, Shanghai, CN;

Assignee:

SIGNIFY HOLDING B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/02 (2006.01); G01S 7/35 (2006.01); G01S 13/87 (2006.01);
U.S. Cl.
CPC ...
G01S 7/0232 (2021.05); G01S 7/356 (2021.05); G01S 13/87 (2013.01);
Abstract

A method of processing an interference detected by a first microwave sensor is disclosed. The method comprising the steps of: receiving, by a second microwave sensor, from the first microwave sensor a message comprising a signal feature profile representing the interference detected by the first microwave sensor; matching, by the second microwave sensor, the signal feature profile comprised in the received message with a stored feature profile, the stored feature profile obtained by the second microwave sensor from its own received signal, and determining, by the second microwave sensor, that the interference detected by the first microwave sensor is caused by the second microwave sensor, if the signal feature profile matches the stored feature profile.


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