The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
May. 20, 2024
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Julian Harms, Munich, DE;
Maximilian Friesinger, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
The application includes a test and/or measurement system having an RF signal source to generate an RF stimulus signal; a device port; a signal path connecting the RF signal source to the device port; a measurement unit coupled to the signal path to measure the RF stimulus signal propagating via the signal path to the device port and a measurement signal received at the device port. A bias tee couples to the signal path and includes a DC input port to receive a DC bias signal. The bias tee couples the DC bias signal into the signal path. The system operates in a calibration mode where at least four different calibration standards are alternately connected to the device port. The system couples the DC bias signal into the signal path during the connection of one or more of the calibration standard(s), but not with all of the calibration standards.