The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Mar. 04, 2024
Applicant:
Fluke Corporation, Everett, WA (US);
Inventors:
Songnan Fan, Shanghai, CN;
Hui Zhao, Shanghai, CN;
Assignee:
Fluke Corporation, Everett, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 15/12 (2006.01);
U.S. Cl.
CPC ...
G01R 35/00 (2013.01); G01R 15/125 (2013.01);
Abstract
A tester includes self-test functions to test a state of a measurement circuit in the tester. For example, the self-test functions test an electrical state, e.g., electrical properties or connection or disconnection states, of a component of the measurement circuit. The self-test functions also test the signal state of an electrical component in the measurement circuit, which may include signal detection, signal transmittance, or measurement properties of the electrical component. The self-test functions improve the user experience of the tester from safety and reliability perspectives.