The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Feb. 17, 2024
Euqlid, Inc., College Park, MD (US);
David Glenn, Cambridge, MA (US);
Cole Meisenhelder, Washington, DC (US);
Stephen Devience, Ellicott City, MD (US);
Connor Hart, Columbia, MD (US);
Aakash Ravi, Laurel, MD (US);
EuQlid, Inc., College Park, MD (US);
Abstract
A solid-state spin sensor system for precisely measuring magnetic fields with a compliantly coupled sensor head exhibiting translational and rotational compliance. The sensor includes a color center ensemble in a solid-state substrate for detecting magnetic fields with high spatial resolution. An optical microscope, in conjunction with an optical driving system, facilitates viewing and spin polarization of the color center ensemble. A magnetic field generator ensures biasing of the ensemble for better sensitivity, and a microwave driving system induces spin transitions within the ensemble. Actuation is controlled by a system responsive to force data or image data for precise positioning of the color center ensemble focally and in contact with a sample. The system generates a spatially resolved map of a magnetic field through analysis of fluorescence data. Methods for measuring and mapping fields with fiducials and force feedback are also included, enabling wide-field quantum sensing of irregular surfaces.