The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jun. 12, 2024
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Mert Celik, Munich, DE;

Baris Guezelarslan, Munich, DE;

Daniel Mueller-Remer, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 29/26 (2013.01); G01R 35/005 (2013.01);
Abstract

A test and/or measurement instrument has a signal generator circuit configured to generate a test signal with a band-limited noise signal, a first port and a second port. The instrument has a first path connected with the first port and the signal generator circuit such that the test signal generated by the signal generator circuit is forwarded to the first port. The instrument has a second path connected with the second port. The has a measurement circuit that receives a measurement signal from the second path, which corresponds to the test signal being processed by the device under test. The measurement circuit is configured to receive the test signal. The measurement circuit is configured to determine a noise contribution of the device under test to the measurement signal based on the test signal and the measurement signal.


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