The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Jun. 20, 2022
Applicant:

Gapwaves Ab, Gothenburg, SE;

Inventors:

Heiko Thiesies, Torslanda, SE;

Marcus Hasselblad, Mölndal, SE;

Assignee:

Gapwaves AB, Gothenburg, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01); H01P 1/165 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 29/0821 (2013.01); H01P 1/165 (2013.01);
Abstract

An adapter arrangement () for automated characterization of an antenna under test, AUT, () with a plurality of radiation elements (). The adapter arrangement () comprises a plate () with a first side () and a second side (), and two or more waveguides () extending through the plate (). Each waveguide has a first aperture () arranged on the first side () of the plate and a second aperture () arranged on the second side () of the plate. The second apertures () are arranged to mate with respective groups of radiation elements () of the AUT (), where a group comprises one or more radiation elements. The first apertures () are arranged to mate with a first probe () with a first probe aperture (). At least one of the first apertures () and/or the first probe aperture () is surrounded by a metamaterial structure ().


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