The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Mar. 02, 2023
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Huaizhi Yang, Beijing, CN;

Jukka Antero Kyrolainen, Oulu, FI;

Lassi Hentila, Kempele, FI;

Jin-Ming Zhao, Beijing, CN;

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0871 (2013.01); G01R 29/0892 (2013.01);
Abstract

A method for modeling an NR DUT using a MIMO OTA test system including a BTS configured to send and receive RF test signals to and from the DUT, and probes configured to reproduce a three-dimensional fading environment for the DUT placed in a quiet zone of an anechoic chamber in response to the RF test signals. The method includes building CIR files for fading channels provided by a channel emulator in the MIMO OTA test system; selecting preferred CIR files from the CIR files having corresponding channel power levels higher than a threshold corresponding to a minimum power level; and performing bi-directional fading emulation with the fading channels using the preferred CIR files, where remaining CIR files are disregarded. The probes reproduce the three-dimensional fading environment for the DUT in the quiet zone using the RF test signals adjusted by the bi-directional fading emulation with the fading channels.


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