The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Jun. 25, 2024
Shimadzu Corporation, Kyoto, JP;
National University Corporation Shimane University, Shimane, JP;
Takanari Hattori, Kyoto, JP;
Jun Watanabe, Kyoto, JP;
Kengo Maeda, Kyoto, JP;
Hironori Kobayashi, Izumo, JP;
Yoshitomo Notsu, Izumo, JP;
SHIMADZU CORPORATION, Kyoto, JP;
NATIONAL UNIVERSITY CORPORATION SHIMANE UNIVERSITY, Shimane, JP;
Abstract
First and second MRM transitions for a target substance, a first reference value concerning a measured intensity of the first MRM transition, and a second reference value concerning the measured-intensity ratio between the first and second MRM transitions are set. MRM measurements of an analyte sample using the first and second MRM transitions are performed to obtain a first intensity of the first MRM transition and a second intensity of the second MRM transition (Stepsand). The value of the first intensity is compared with the first reference value to determine whether the target substance is possibly contained (first determination; Step). For a target substance considered to be possibly contained in the analyte sample, the ratio between the first and second intensities is compared with the second reference value to determine whether the target substance is contained (second determination; Step).